Normal view MARC view ISBD view

Modern developments in electron microscopy Benjamin M. Siegel.

Siegel, Benjamin M.

Modern developments in electron microscopy Benjamin M. Siegel. - New York Academic Press 1964 - xiii, 432p.

Subjects--Topical Terms:
Electron microscopes Microscopes Electron microscopy - technique.

Dewey Class. No.: 537.533 / S44M

Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)