Digital systems testing and testable design 
edited by Miron Abramovici, Velvin A. Breuer, Arthur D. Friedman. 
 - Delhi  Jaico Pub. House  2001 
 - xvii, 652p.; 24cm. 
<br/><br/><label>ISBN: </label>8172248911 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic Engineering; Electronic Computers.
<br/><br/><label>Dewey Class. No.: </label>621.3916  / D44D