Siegel, Benjamin M. <br/><br/>
Modern developments in electron microscopy  Benjamin M. Siegel. 

 - New York  Academic Press  1964 
 - xiii, 432p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopes Microscopes Electron microscopy - technique.
<br/><br/><label>Dewey Class. No.: </label>537.533  / S44M